LI-COR LI-3100C Leaf Area Meter
The LI-3100C Leaf Area Meter is a rugged bench-top instrument designed to quickly digitize the area, length, and width of leaves.
MicroLine systems feature the highest quality microscope optics, motorized autofocus, manually operated stages and fully programmable illumination and measurement recipes. Reflected illumination is standard and transmitted illumination is available as an option. MicroLine systems are capable of measuring bright and dark lines, semi-transparent layers, lines with irregular edges and other critical features.
The MicroLine systems are well suited to measure wafers, masks, MEMS, and other micro-fabricated parts. These capable desktop instruments provide precise optical measurement for features as small as 0.5 microns on parts up to 300 x 300 mm. With its advanced lighting and optics, the MicroLine boasts robust capabilities for measuring transparent layers, lines with irregular edges, and more.
The LI-3100C Leaf Area Meter is a rugged bench-top instrument designed to quickly digitize the area, length, and width of leaves.
The SC7620 is a compact entry-level SEM sputter coater. When combined with the optional SC7620-CF carbon fibre evaporation attachment, it makes the ideal low-cost SEM sputtering and carbon coating system package.
Pushing the boundaries of ICP MS applications μL
Water quality analysis is repeatedly performed in laboratories on a daily basis. Our high-end benchtop model was developed to provide simplicity with excellent on-site usability – from operation and maintenance through to troubleshooting.
The K850WM Critical Point Dryer is a compact, bench-top instrument designed to critical point dry a complete 6″/150 mm wafer. A convenient wafer holder allows rapid transfer and ensures that pre-drying does not occur.
Utilizing minimal bench space and providing an easy to read digital display in centipoise or centistokes, the ViscoLab 3000 delivers accurate measurements with a small sample size; less than 2ml of fluid is required.
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